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X-ray scattering laboratory

Bruker D8 DISCOVERY X-ray diffractometer/reflectometer

D8 diffractometer with 1D detector
D8 diffractometer with 1D detector

with the following options

  • Diffraction
  • Grazing incidence diffraction
  • Reflectivity
  • Wide temperature range cell from 80 up to 1873 K for diffraction, up to 1100 K for reflectivity
  • 1D position densitive VANTEC detector

It is used for the investigation of

  • The crystalline structure of materials in bulk, powder or film form
  • Phase formation
  • In-situ kinetic studies of phase transformations
  • Micro-stress determination
  • Grain size determination of nano-structured materials <500 µm)
  • Layered structure (density, thickness, roughness) of films and multilayers

 

High temperature X-ray diffraction cell
High temperature X-ray diffraction cell
In-situ XRD FeCr
Phase transition from bcc α in fcc γ in Fe-5at%Cr alloy during in-situ heating/cooling.

 

 

 

 

 

 

 

 

Kratky small angle X-ray scattering camera

It is used for the investigation of inhomogeneities in a matrix having sizes between 1 and 100 nm.

A Cu Kα X-ray beam is used in transmission mode in vacuum. The scattered beam is detected at low angles by 1D position sensitive detector.

Small angle X-ray scattering camera
Small angle X-ray scattering camera